Room-temperature scanning Hall probe microscope (RT-SHPM) imaging of garnet films using new high-performance InSb sensors

被引：29

作者：

Oral, A ^{[1
]}

Kaval, M

Dede, M

Masuda, H

Okamoto, A

Shibasaki, I

Sandhu, A

机构：

[1] Bilkent Univ, Dept Phys, TR-06533 Bilkent, Turkey

[2] Toei Kogyo Ltd, Machida, Tokyo 1940035, Japan

[3] Asahikasei Corp, Fuji, Shizuoka 4168501, Japan

[4] Tokai Univ, Dept Elect & Elect Engn, Hiratsuka, Kanagawa 2591292, Japan

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2002年 / 38卷 / 05期

关键词：

Hall effect; scanning Hall probe microscopy;

D O I：

10.1109/TMAG.2002.803607

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

High-performance InSb micro-HaIl sensors were fabricated by optical lithography and incorporated in a room-temperature scanning Hall probe microscope for imaging of localized magnetic fluctuations in close proximity to the surfaces of crystalline uniaxial garnet films. The room-temperature noise figure of the InSb sensors was 6-10 mG/v/Hz, which is an order of magnitude better than GaAs-AlGaAs two-dimensional electron gas sensors used to date.

引用

收藏

页码：2438 / 2440

页数：3

相关论文

共 11 条

[1] NEAR-FIELD MAGNETOOPTICS AND HIGH-DENSITY DATA-STORAGE [J].

BETZIG, E ;

TRAUTMAN, JK ;

WOLFE, R ;

GYORGY, EM ;

FINN, PL ;

KRYDER, MH ;

CHANG, CH .

APPLIED PHYSICS LETTERS, 1992, 61 (02) :142-144

[2] MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION [J].

MARTIN, Y ;

WICKRAMASINGHE, HK .

APPLIED PHYSICS LETTERS, 1987, 50 (20) :1455-1457

[3]

*NAN INSTR LTD, ROOM TEMP SCANN HALL

[4] InSb thin films grown on GaAs substrate and their magneto-resistance effect [J].

Okamoto, A ;

Ashihara, A ;

Akaogi, T ;

Shibasaki, I .

JOURNAL OF CRYSTAL GROWTH, 2001, 227 :619-624

[5] Real-time scanning hall probe microscopy [J].

Oral, A ;

Bending, SJ ;

Henini, M .

APPLIED PHYSICS LETTERS, 1996, 69 (09) :1324-1326

[6] Scanning Hall probe microscopy of superconductors and magnetic materials [J].

Oral, A ;

Bending, SJ ;

Henini, M .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02) :1202-1205

[7] Direct magnetic imaging of ferromagnetic domain structures by room temperature scanning hall probe microscopy using a bismuth micro-hall probe [J].

Sandhu, A ;

Masuda, H ;

Oral, A ;

Bending, SJ .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2001, 40 (5B) :L524-L527

[8] Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy [J].

Sandhu, A ;

Masuda, H ;

Kurosawa, K ;

Oral, A ;

Bending, SJ .

ELECTRONICS LETTERS, 2001, 37 (22) :1335-1336

[9] Room temperature sub-micron magnetic imaging by scanning Hall probe microscopy [J].

Sandhu, A ;

Masuda, H ;

Oral, A ;

Bending, SJ .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (6B) :4321-4324

[10] DOMAIN OBSERVATIONS ON COCR-LAYERS WITH A DIGITALLY ENHANCED KERR-MICROSCOPE [J].

SCHMIDT, F ;

HUBERT, A .

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1986, 61 (03) :307-320