Local Charge Trapping in Conjugated Polymers Resolved by Scanning Kelvin Probe Microscopy

被引：61

作者：

Hallam, Toby ^{[1
]}

Lee, MiJung ^{[1
]}

Zhao, Ni ^{[1
]}

Nandhakumar, Iris ^{[2
]}

Kemerink, Martijn ^{[1
,3
]}

Heeney, Martin ^{[4
]}

McCulloch, Iain ^{[4
]}

Sirringhaus, Henning ^{[1
]}

机构：

[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 OHE, England

[2] Univ Southampton, Sch Chem, Southampton SO17 1BJ, Hants, England

[3] Eindhoven Univ Technol, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands

[4] Univ London Imperial Coll Sci Technol & Med, Dept Chem, London SW7 2AZ, England

来源：

PHYSICAL REVIEW LETTERS | 2009年 / 103卷 / 25期

基金：

英国工程与自然科学研究理事会;

关键词：

FIELD-EFFECT TRANSISTORS; SEMICONDUCTING POLYMERS; MOBILITY; REAL;

D O I：

10.1103/PhysRevLett.103.256803

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The microstructure of conjugated polymers is heterogeneous on the length scale of individual polymer chains, but little is known about how this affects their electronic properties. Here we use scanning Kelvin probe microscopy with resolution-enhancing carbon nanotube tips to study charge transport on a 100 nm scale in a chain-extended, semicrystalline conjugated polymer. We show that the disordered grain boundaries between crystalline domains constitute preferential charge trapping sites and lead to variations on a 100 nm scale of the carrier concentration under accumulation conditions.

引用

页数：4

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