Characterisation of freeze-dried porous silicon

被引：10

作者：

Amato, G ^{[1
]}

Brunetto, N ^{[1
]}

Parisini, A ^{[1
]}

机构：

[1] CNR,LAMEL,I-40126 BOLOGNA,ITALY

来源：

THIN SOLID FILMS | 1997年 / 297卷 / 1-2期

关键词：

porous silicon; drying; optical properties;

D O I：

10.1016/S0040-6090(96)09412-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The first characterisation results on freeze-dried porous silicon are reported. The freeze drying process is shown to be highly non-destructive. The samples so far obtained on substrates with different doping density show better morphological, optical and photoluminescence properties. The first structural information on freeze-dried PS have been obtained by Raman and transmission electron microscopy techniques. Compared with other drying techniques, freeze drying appears to be a simple and contamination-free method. (C) 1997 Elsevier Science S.A.

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页码：73 / 78

页数：6

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