Electronic structure of vertically stacked InAs self-assembled quantum dots by deep level transient spectroscopy

被引:4
作者
Li, SW
Koike, K
Yano, M
Jin, YX
机构
[1] Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, Changchun 130021, Peoples R China
[2] Osaka Inst Technol, New Mat Res Ctr, Asahi Ku, Osaka 5358585, Japan
基金
日本学术振兴会;
关键词
photoluminescence; self-assembled quantum dots; optical properties; deep level transient spectroscopy;
D O I
10.1016/S0921-4526(02)01427-8
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A quantum dot (QD) can capture and emit carriers, the behavior of which is similar to that of a giant trap, and stacked QDs with a size-controlled growth show a strong tendency to align vertically. The discrete energy level properties of the self-assembled vertically stacked InAs QDs in Al0.5Ga0.5As are studied by means of deep level transient spectroscopy (DLTS) and photoluminescence (PL) spectroscopy, The DLTS measurement displays the spectra of hole and electron discrete energy levels as positive and negative peaks, respectively, which illustrates that the DLTS is a capable tool to study the optical and electrical properties of the QDs. The PL emission peaks are found to completely correspond to the DLTS signals. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:41 / 45
页数:5
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