The influence of subgap features in the electromodulation and built-in voltage measurements of polyfluorene blue light-emitting diodes with anodic charge injection layers

被引:14
作者
Bodrozic, Vladimir
Roberts, M.
Phillips, N.
Burroughes, J. H.
Mian, Shabbir
Cacialli, Franco
机构
[1] Cambridge Display Technol, Cambridge CB3 0TX, England
[2] UCL, Dept Phys & Astron, London WC1E 6BT, England
[3] UCL, London Ctr Nanotechnol, London WC1E 6BT, England
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1063/1.2717612
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on electroabsorption (EA) and built-in voltage (V(BI)) measurements of polymer light-emitting diodes with the general structure ITO/PEDOT:PSS/emitting polymer/LiF/Ca/Al where ITO is indium tin oxide, PEDOT:PSS is poly(3,4-ethylene dioxythiophene) doped with poly(styrene sulfonate), and the emitting polymer is either poly(9,9-dioctylfluorene), poly(9, 9-dioctyl-fluorene-alt-bis-N,N(')-(4-butyl-phenyl)-bis-N, N(')-phenyl-1, 4-phenylenediamine), or poly(9,9-dioctylfluorene-alt-N-(4-butylphenyl)-diphenylamine). We find that the EA nulling voltage, i.e., the dc bias at which the EA signal vanishes, depends on the frequency of the ac voltage and on the incident photon wavelength. Such dependence poses a problem for accurate measurement of the built-in voltage (V(BI)), which is the voltage generated between the electrodes upon equilibration of the Fermi levels through the heterostructure. We find that the EA signal is mixed with a smaller intensity signal which can be ascribed to excited state absorption (ESA). We propose a method for separating the excited state absorption signal and producing accurate V(BI) measurements. We also demonstrate that in our devices the ESA contribution to the electromodulated (Delta T/T) signal is negligible with respect to the accuracy with which V(BI) can be determined from the nulling voltage of Delta T/T and can thus be safely ignored.
引用
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页数:9
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共 30 条
[21]   Increased brightness and lifetime of polymer light-emitting diodes with polyaniline anodes [J].
Karg, S ;
Scott, JC ;
Salem, JR ;
Angelopoulos, M .
SYNTHETIC METALS, 1996, 80 (02) :111-117
[22]   Degradation in blue-emitting conjugated polymer diodes due to loss of ohmic hole injection [J].
Khan, RUA ;
Bradley, DDC ;
Webster, MA ;
Auld, JL ;
Walker, AB .
APPLIED PHYSICS LETTERS, 2004, 84 (06) :921-923
[23]  
Kim JS, 2002, ADV MATER, V14, P206, DOI 10.1002/1521-4095(20020205)14:3<206::AID-ADMA206>3.0.CO
[24]  
2-J
[25]   Indium-tin oxide treatments for single- and double-layer polymeric light-emitting diodes: The relation between the anode physical, chemical, and morphological properties and the device performance [J].
Kim, JS ;
Granstrom, M ;
Friend, RH ;
Johansson, N ;
Salaneck, WR ;
Daik, R ;
Feast, WJ ;
Cacialli, F .
JOURNAL OF APPLIED PHYSICS, 1998, 84 (12) :6859-6870
[26]   Electric field screening in polymer light-emitting diodes [J].
Lane, PA ;
deMello, JC ;
Fletcher, RB ;
Bernius, M .
APPLIED PHYSICS LETTERS, 2003, 83 (17) :3611-3613
[27]   Interfacial chemistry of Alq3 and LiF with reactive metals [J].
Mason, MG ;
Tang, CW ;
Hung, LS ;
Raychaudhuri, P ;
Madathil, J ;
Giesen, DJ ;
Yan, L ;
Le, QT ;
Gao, Y ;
Lee, ST ;
Liao, LS ;
Cheng, LF ;
Salaneck, WR ;
dos Santos, DA ;
Brédas, JL .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (05) :2756-2765
[28]   Ohmic hole injection in poly(9,9-dioctylfluorene) polymer light-emitting diodes [J].
Poplavskyy, D ;
Nelson, J ;
Bradley, DDC .
APPLIED PHYSICS LETTERS, 2003, 83 (04) :707-709
[29]   Modification of PEDOT-PSS by low-energy electrons [J].
van der Gon, AWD ;
Birgerson, J ;
Fahlman, M ;
Salaneck, WR .
ORGANIC ELECTRONICS, 2002, 3 (3-4) :111-118
[30]   Recent development of polyfluorene-based RGB materials for light emitting diodes [J].
Wu, WS ;
Inbasekaran, M ;
Hudack, M ;
Welsh, D ;
Yu, WL ;
Cheng, Y ;
Wang, C ;
Kram, S ;
Tacey, M ;
Bernius, M ;
Fletcher, R ;
Kiszka, K ;
Munger, S ;
O'Brien, J .
MICROELECTRONICS JOURNAL, 2004, 35 (04) :343-348