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Observation of fast spontaneous emission decay in GaInAsP photonic crystal point defect nanocavity at room temperature
被引:70
作者:
Baba, T
Sano, D
Nozaki, K
Inoshita, K
Kuroki, Y
Koyama, F
机构:
[1] Yokohama Natl Univ, Dept Elect & Comp Engn, Hodogaya Ku, Yokohama, Kanagawa, Japan
[2] Tokyo Inst Technol, Precis & Intelligence Lab, Midori Ku, Yokohama, Kanagawa 2268503, Japan
基金:
日本学术振兴会;
日本科学技术振兴机构;
关键词:
D O I:
10.1063/1.1811379
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
The spontaneous emission decay in a photonic crystal slab nanocavity with a GaInAsP quantum well active region was measured at room temperature. Even far below lasing threshold, the decay was much faster than that for the as-grown wafer. A consideration including the enhanced spontaneous emission rate by the Purcell effect, intraband relaxation of carriers, nonradiative surface recombination, spatial hole burning, and carrier diffusion enabled us to explain different decay lifetime between on- and off-resonant conditions and between different size cavities. As a result, >16-fold shorter spontaneous emission lifetime was estimated, which strongly suggests the existence of a large Purcell effect. (C) 2004 American Institute of Physics.
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页码:3989 / 3991
页数:3
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