Dynamic-threshold CMOS SRAM cells for fast, portable applications

被引:16
作者
Bhavnagarwala, AJ [1 ]
Kapoor, A [1 ]
Meindl, JD [1 ]
机构
[1] Georgia Inst Technol, Microelect Res Ctr, Atlanta, GA 30332 USA
来源
13TH ANNUAL IEEE INTERNATIONAL ASIC/SOC CONFERENCE, PROCEEDINGS | 2000年
关键词
D O I
10.1109/ASIC.2000.880764
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A novel quad-rail CMOS SRAM cell architecture that doubles cell read current, improves cell static noise margin (SNM) by 70%, increases cell immunity to SER and lowers cell standby power by over an order of magnitude is proposed. These improvements are achieved by implementing a scheme of WL transition triggered pulses on source and substrate terminals of cell inverter transistors that share a common WL.
引用
收藏
页码:359 / 363
页数:5
相关论文
共 13 条
[1]  
BATEMAN B, 1998, TUTORIAL ISSCC FEB
[2]  
BURGER D, 24 INT S COMP ARCH J
[3]  
INOHARA M, 1998, IEEE S VLSI TECH JUN, P64
[4]   A novel 6T-SRAM cell technology designed with rectangular patterns scalable beyond 0.18 μm generation and desirable for ultra high speed operation [J].
Ishida, M ;
Kawakami, T ;
Tsuji, A ;
Kawamoto, N ;
Motoyoshi, M ;
Ouchi, N .
INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST, 1998, :201-204
[5]   TRENDS IN LOW-POWER RAM CIRCUIT TECHNOLOGIES [J].
ITOH, K ;
SASAKI, K ;
NAKAGOME, Y .
PROCEEDINGS OF THE IEEE, 1995, 83 (04) :524-543
[6]  
ITOH K, 1997, TUTORIAL
[7]  
ITOH K, 1996, IEEE S VLSI CKTS JUN, P132
[8]   EFFECT OF RANDOMNESS IN DISTRIBUTION OF IMPURITY ATOMS ON FET THRESHOLDS [J].
KEYES, RW .
APPLIED PHYSICS, 1975, 8 (03) :251-259
[9]  
MEINDL J, 1997, P INT SOL STAT CIRC, P232
[10]  
MIZUNO H, 1995 S VLSI CKTS, P25