Hysteresis and threshold voltage shift of pentacene thin-film transistors and inverters with Al2O3 gate dielectric

被引:51
作者
Koo, Jae Bon [1 ]
Ku, Chan Hoe [1 ]
Lim, Sang Chul [1 ]
Kim, Seong Hyun [1 ]
Lee, Jung Hun [1 ]
机构
[1] ETRI, IT Convergence & Component Lab, Taejon 305700, South Korea
关键词
D O I
10.1063/1.2717015
中图分类号
O59 [应用物理学];
学科分类号
摘要
The pentacene organic thin-film transistors (OTFTs) with plasma-enhanced atomic-layer-deposited 150 nm thick Al2O3 as a gate dielectric and the inverters comprised of these OTFTs have been fabricated. The hysteresis in transfer characteristics of the OTFTs depends on the scan range of negative gate voltage, regardless of drain voltage. Negative gate-bias stress leads to the progressive negative shift of threshold voltage. The hysteresis of D inverter is similar to that of E inverter, but the former has a wider swing range and a higher gain in comparison with the latter. (c) 2007 American Institute of Physics.
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页数:3
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