Embedded front-end for charge amplifier configuration with sub-threshold MOSFET continuous reset

被引:12
作者
Guazzoni, C
Sampietro, M
Fazzi, A
Lechner, P
机构
[1] Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy
[2] Politecn Milan, Dipartimento Ingn Nucl CESNEF, I-20133 Milan, Italy
[3] KETEK GMBH, D-81739 Munich, Germany
关键词
D O I
10.1109/23.872993
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The paper reports the considerations necessary to design state-of the art front-end electronic devices integrated on silicon X-ray detectors to perform functional charge amplification. In particular it concentrates on the characteristics of a MOSFET feedback device operated in subthreshold mode to perform a continuous reset of the feedback capacitance with minimum added noise and maximum linearity. Details of the external microelectronic circuitry that complements the front-end devices are also given. The designed two-chip system aims to reach very high stability in charge-to-voltage conversion and to fulfill the requirements of the most advances X-ray spectroscopy experiments.
引用
收藏
页码:1442 / 1446
页数:5
相关论文
共 16 条
[1]  
*AMS AUSTR MIK SYS, 0 8 MU BICMOS TECHNR
[2]  
BACCARANI G, 1985, P 4 INT C NUM AN SEM, P3
[3]   Continuous charge restoration in semiconductor detectors by means of the gate-to-drain current of the integrated front-end JFET [J].
Fiorini, C ;
Lechner, P .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1999, 46 (03) :761-764
[4]  
GIACOVAZZO C, 1992, FUNDAMENTALS CRISTAL
[5]   Multiple-energy x-ray holography: Atomic images of hematite (Fe2O3) [J].
Gog, T ;
Len, PM ;
Materlik, G ;
Bahr, D ;
Fadley, CS ;
SanchezHanke, C .
PHYSICAL REVIEW LETTERS, 1996, 76 (17) :3132-3135
[6]   Detector embedded device for continuous reset of charge amplifiers: choice between bipolar and MOS transistor [J].
Guazzoni, C ;
Sampietro, M ;
Fazzi, A .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2000, 443 (2-3) :447-450
[7]   Silicon drift detectors for high resolution room temperature X-ray spectroscopy [J].
Lechner, P ;
Eckbauer, S ;
Hartmann, R ;
Krisch, S ;
Hauff, D ;
Richter, R ;
Soltau, H ;
Struder, L ;
Fiorini, C ;
Gatti, E ;
Longoni, A ;
Sampietro, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1996, 377 (2-3) :346-351
[8]  
NEAMEN DA, 1992, SEMICONDUCTOR PHYSIC
[9]   THE PN-CCD ON-CHIP ELECTRONICS [J].
PINOTTI, E ;
BRAUNINGER, H ;
FINDEIS, N ;
GORKE, H ;
HAUFF, D ;
HOLL, P ;
KEMMER, J ;
LECHNER, P ;
LUTZ, G ;
KINK, W ;
MEIDINGER, N ;
METZNER, G ;
PREDEHL, P ;
REPPIN, C ;
STRUDER, L ;
TRUMPER, J ;
VONZANTHIER, C ;
KENDZIORRA, E ;
STAUBERT, R ;
RADEKA, V ;
REHAK, P ;
BERTUCCIO, G ;
GATTI, E ;
LONGONI, A ;
PULLIA, A ;
SAMPIETRO, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1993, 326 (1-2) :85-91
[10]   IMPLANTED SILICON JFET ON COMPLETELY DEPLETED HIGH-RESISTIVITY DEVICES [J].
RADEKA, V ;
REHAK, P ;
RESCIA, S ;
GATTI, E ;
LONGONI, A ;
SAMPIETRO, M ;
BERTUCCIO, G ;
HOLL, P ;
STRUDER, L ;
KEMMER, J .
IEEE ELECTRON DEVICE LETTERS, 1989, 10 (02) :91-94