Highly conductive microcrystalline silicon carbide films deposited by the hot wire cell method and its application to amorphous silicon solar cells

被引:29
作者
Miyajima, S
Yamada, A
Konagai, M
机构
[1] Tokyo Inst Technol, Dept Phys Elect, Meguro Ku, Tokyo 1528552, Japan
[2] Tokyo Inst Technol, Res Ctr Quantum Effect Elect, Meguro Ku, Tokyo 1528552, Japan
关键词
hot wire cell method; low temperature deposition; mu c-Si1-xCx; solar cell;
D O I
10.1016/S0040-6090(03)00132-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Microcrystalline silicon carbide (muc-Si1-xCx) films were successfully deposited by the hot wire cell method using a gas mixture of SiH4, H-2 and C2H2. It was confirmed by Fourier transform infrared and X-ray diffraction analyses that the films consisted of muc-Si grains embedded in a-Si1-xCx tissue. The p-type muc-Si1-xCx films were deposited using B2H6 as a doping gas. A dark conductivity of 0.2 S/cm and an activation energy of 0.067 eV were obtained. The p-type muc-Si1-xCx was used as a window layer of a-Si solar cells, in which the intrinsic layer was deposited by photo-chemical vapor deposition, and an initial conversion efficiency of 10.2% was obtained. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:274 / 277
页数:4
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