Fabrication of indium phosphide compound photonic crystal by hydrogen iodide/xenon inductively coupled plasma etching

被引:11
作者
Fujita, M [1 ]
Sugitatsu, A
Uesugi, T
Noda, S
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Nishikyo Ku, Kyoto 6158510, Japan
[2] Mitsubishi Electr Corp, Informat Technol R&D Ctr, Itami, Hyogo 6648641, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2004年 / 43卷 / 11A期
关键词
dry etching; GaInAsP; hydrogen iodide (HI); indium phosphide (InP); inductively coupled plasma (ICP); microfabrication; photonic crystal;
D O I
10.1143/JJAP.43.L1400
中图分类号
O59 [应用物理学];
学科分类号
摘要
An InP-based photonic crystal with vertical hole (similar to90degrees), smooth sidewall (<10nm) and high uniformity (+/-1%), is successfully fabricated by inductively coupled plasma (ICP) etching using HI-based gas with only an electron beam resist mask. This can be achieved at a low-temperature processing condition because of the high volatility and sidewall protection of the iodide product. The etching condition is optimized to balance the ion and radial effects by controlling the applied bias and the mixture of Xe gas. We can conclude that HI/Xe ICP etching is very useful for the fabrication of active nano/microdevices.
引用
收藏
页码:L1400 / L1402
页数:3
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