Stacking, polarization control, and lasing (1.55 μm region) InAs/InGaAsP/InP (100) quantum dots

被引:12
作者
Anantathanasarn, S. [1 ]
Notzel, R. [1 ]
van Veldhoven, P. J. [1 ]
van Otten, F. W. M. [1 ]
Eijkemans, T. J. [1 ]
Barbarin, Y. [1 ]
de Vries, T. [1 ]
Smalbrugge, E. [1 ]
Geluk, E. J. [1 ]
Bente, Eatm. [1 ]
Oei, Y. S. [1 ]
Smit, M. K. [1 ]
Wolter, J. H. [1 ]
机构
[1] Eindhoven Univ Technol, eiTT, COBRA, Interuniv Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
关键词
quantum dot; metalorganic vapor-phase epitaxy; InAs; InGaAsP; B1; InP (100); laser diodes;
D O I
10.1016/j.jcrysgro.2006.10.173
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We report the growth, device fabrication, and performance of stacked InAs/InGaAsP/InP (10 0) quantum dots (QDs) in telecom lasers. Wavelength tuning of the QDs grown by metalorganic vapor-phase epitaxy (MOVPE) over the 1.55-mu m region at room temperature (RT) is achieved using ultrathin GaAs interlayers underneath the QDs, which suppress As/P exchange to reduce the QD height in a controlled way. Unpolarized photoluminescence from the cleaved side, important for realization of polarization-insensitive semiconductor optical amplifiers, is obtained for closely stacked QDs due to vertical electronic coupling. The wavelength shift due to group-V-atom intermixing in the QDs during growth at higher temperatures of device structures is compensated by adjusting the GaAs interlayer thickness and V/III flow ratio during QD growth. Device quality of the QDs is highlighted by continuous-wave ground-state lasing at RT of narrow ridge-waveguide QD lasers. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:553 / 557
页数:5
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