Atomic force microscopy as a tool to correlate nanostructure to properties of glasses

Atomic force microscopy (AFM) provides high resolution images of surfaces even if they are non-conducting. Thus, glass can be investigated without conductive preparation or other complicated preparation techniques. So far, the great advantage of this microscopy in ambient atmosphere impeded atomic resolution on vitreous surfaces. However, AFM proved to be an appropriate tool for imaging the structure on a nanometre scale, of glasses, glass ceramics and coatings on glass. AFM serves to detect surface defects and changes in the overall surface topology after different treatments, such as polishing, cleaning, aging and corroding. With the help of suitable preparation, volume properties can also be investigated with a spatial resolution in the nanometre range. AFM contributions to glass research fields like fracture mechanics, crystallization, interfaces and gel consolidation are reviewed in this paper. (C) 1997 Elsevier Science B.V.