Wear of single silicon as a function of surface roughness

With increasing activities on micro electro-mechanical systems (MEMS) type microactuators, there is a growing need in understanding the tribological properties of silicon, the most commonly used wafer material for those devices. In particular, it is of interest if single crystal silicon used in microactuators exposed to rather low vertical loads is subject to wear. Therefore, wear tests using monocrystalline, silicon on both sides of the tribological interface were conducted. A classic way to measure wear on sliders in contact with a tape or a rotating disk is to create an imprint using a Berkovich diamond tip mounted on a picoindenter. However, in our case we used a different approach. We created three studs on a slider's surface by recessing the material outside the studs through an ion milling process. During the wear tests, the studs wore off. By measuring the remaining stud height, the wear volume could be determined at any point in time. The tests were performed on a pin on disk tester with a gimbaled slider to realize a flat on flat contact and a rather low normal force of 30 mN. (C) 2003 Elsevier Science B.V. All rights reserved.