Channels of Cd diffusion and stoichiometry in CdTe grown by molecular beam epitaxy

被引:19
作者
Barcz, A [1 ]
Karczewski, G
Wojtowicz, T
Sadlo, M
Kossut, J
机构
[1] Inst Electr Mat Technol, PL-02668 Warsaw, Poland
[2] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland
关键词
D O I
10.1063/1.120686
中图分类号
O59 [应用物理学];
学科分类号
摘要
By studying the diffusion of specially incorporated thin Mn markers in molecular beam epitaxy-grown CdTe, we can investigate quantitatively deviations from stoichiometry as well as the details of Cd diffusion in the crystal. In CdTe layers deficient in Cd, the diffusion proceeds through V-Cd vacancies, with the activation energy of 2.1 eV, characteristic for bulk CdTe. In CdTe grown in excess Cd flux, the evaluated activation energy of 1.4 eV for Cd self-diffusion is characteristic to Te self-diffusion in bulk CdTe, which implies that the flow of Cd atoms is mediated by V-Te, vacancies with formation of a virtual Cd-Te antisite defect. A striking correlation of the occurrence of the minimum of electrical resistivity in In-doped CdTe with nearly perfect stoichiometry with the minimum of the diffusivity of Mn provides further support of this interpretation. (C) 1998 American Institute of Physics.
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收藏
页码:206 / 208
页数:3
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