The incorporation of arsenic in GaN by metalorganic chemical vapor deposition

被引:83
作者
Li, X [1 ]
Kim, S [1 ]
Reuter, EE [1 ]
Bishop, SG [1 ]
Coleman, JJ [1 ]
机构
[1] Univ Illinois, Microelect Lab, Urbana, IL 61801 USA
关键词
D O I
10.1063/1.121242
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the successful incorporation of arsenic (As) in GaN during metalorganic chemical vapor deposition (MOCVD). A characteristic room-temperature luminescence band centered around 2.6 eV (480 nm), similar to the peak position of the As ion-implanted GaN, is found to be related to the As impurity in the MOCVD grown GaN:As films. The arsenic incorporation efficiency as a function of experimental conditions and structure is presented. Temperature- and power-dependent cathodoluminescence measurements have been performed to help establish the nature of the As-related peak. (C) 1998 American Institute of Physics.
引用
收藏
页码:1990 / 1992
页数:3
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