An interfacial defect layer observed at (Ba,Sr)TiO3/Pt interface

被引：25

作者：

Jin, HZ

Zhu, J ^{[1
]}

Ehrhart, P

Fitsilis, F

Jia, CL

Regnery, S

Urban, K

Waser, R

机构：

[1] Tsinghua Univ, Dept Mat Sci & Engn, Beijing 100084, Peoples R China

[2] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany

来源：

THIN SOLID FILMS | 2003年 / 429卷 / 1-2期

基金：

中国国家自然科学基金;

关键词：

transmission electron microscopy; interfacial defect layer; barium strontium titanate; high-density storage;

D O I：

10.1016/S0040-6090(02)01330-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Barium strontium titanate (Ba,Sr)TiO3 (BST) thin-films on Pt-substrates were studied by transmission electron microscopy. The films show a columnar structure with the grains of 10-50 nm in diameter. These are oriented parallel to the [0 0 1] direction which in turn is parallel to the film growth direction. No amorphous intergrain regions occur. The high-resolution lattice fringe pictures show for the first time that over horizontally extended areas of the interface the lattice of the BST film is modified by the introduction of a defect layer. This observation is discussed in terms of a structural origin of the so-called dead-layer effect responsible for a reduction of the film permittivity with decreasing foil thickness. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

收藏

页码：282 / 285

页数：4

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