An embedded overlay concept for microsystems packaging

被引:5
作者
Butler, JT [1 ]
Bright, VM
机构
[1] USAF, Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
[2] Univ Colorado, Dept Mech Engn, Boulder, CO 80309 USA
来源
IEEE TRANSACTIONS ON ADVANCED PACKAGING | 2000年 / 23卷 / 04期
关键词
Chip-on-flex; microelectromechanical systems; microsystems packaging;
D O I
10.1109/6040.883750
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An embedded overlay concept for packaging hybrid components containing microelectromechanical systems (MEMS) is described, This packaging process is a derivative of the chip-on-flex (COF) process currently used for microelectronics packaging. COB is a high performance, multichip packaging technology in which die are encased in a molded plastic substrate and interconnects are made via a thin-film structure formed over the components. A laser ablation process has been developed which enables selected areas of the COF overlay to be efficiently ablated with minimal impact to the packaged MEMS devices, Analysis and characterization of the ablation procedures used in the standard COF process was performed to design a new procedure which minimized the potential for heat damage to exposed MEMS devices. The COF/MEMS packaging technology is well-suited for many microsystem packaging applications such as micro-optics and radio frequency (RF) devices.
引用
收藏
页码:617 / 622
页数:6
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