Patterning of indium tin oxide by projection photoablation and lift-off process for fabrication of flat-panel displays

被引:38
作者
Chae, Junghun
Appasamy, Sreeram
Jain, Kanti
机构
[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
[2] Anvik Corp, Hawthorne, NY 10532 USA
关键词
D O I
10.1063/1.2751594
中图分类号
O59 [应用物理学];
学科分类号
摘要
Indium tin oxide (ITO), an important material used as a transparent conductive oxide in thin-film transistor liquid-crystal display fabrication, was patterned by a nonlithographic process. First, a Si3N4 substrate coated with photoresist was patterned by a projection photoablation process using 248 nm wavelength KrF excimer laser radiation. ITO was then deposited by sputtering and patterned by lift-off. The resulting ITO pattern was clean even though it was patterned without the conventional steps of photoresist development and ITO etching. This process technology provides a faster and more economical patterning capability compared to conventional photolithography and etch processes used in the display industry. (c) 2007 American Institute of Physics.
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页数:3
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