Molecular beam epitaxy of high magnesium content single-phase wurzite MgxZn1-xO alloys (x ≃ 0.5) and their application to solar-blind region photodetectors

被引:148
作者
Takagi, T [1 ]
Tanaka, H
Fujita, S
Fujita, S
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan
[2] Kyoto Univ, Int Innovat Ctr, Sakyo Ku, Kyoto 6068501, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2003年 / 42卷 / 4B期
关键词
MgZnO; MBE; ZnO buffer layer; solar-blind spectral region; UV photodetector;
D O I
10.1143/JJAP.42.L401
中图分类号
O59 [应用物理学];
学科分类号
摘要
A series of single-phase wurzite MgxZn1-xO alloys from x = 0 to 0.5 were successfully obtained by molecular beam epitaxial growth on sapphire substrates, resulting in artificial tuning of band gap energy E-g from 3.3 to 4.5 eV which covers UV-A, UV-B, and solar-blind spectral regions. The problem of phase separation ever reported in the growth of MgxZn1-xO with higher Mg content, e.g., x > 0.4 and E-g > 3.9 eV, has been overcome by using a ZnO buffer layer. The Mg0.5Zn0.5O layers have been applied to a planar geometry Schottky type metal-semiconductor-metal photodetector, exhibiting the photoresponse for the wavelength shorter than 270 nm which correspond to the solar-blind region.
引用
收藏
页码:L401 / L403
页数:3
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