Strontium titanate resistance modulation by ferroelectric field effect

被引:8
作者
Marré, D
Tumino, A
Bellingeri, E
Pallecchi, I
Pellegrino, L
Siri, AS
机构
[1] INFM, LAMIA, CNR, IMEM, I-16146 Genoa, Italy
[2] Dipartimento Fis, I-16146 Genoa, Italy
关键词
D O I
10.1088/0022-3727/36/7/319
中图分类号
O59 [应用物理学];
学科分类号
摘要
Among perovskite oxides strontium titanate (STO) SrTiO3 undergoes a metal-insulator transition at very low carrier concentration and exhibits high mobility values at low temperature. We exploited such electrical properties and the structural compatibility of perovskite oxide materials in realizing ferroelectric field effect epitaxial heterostructures. By pulsed laser deposition, we grew patterned field effect devices, consisting of lanthanum doped STO and Pb(Zr,Ti)O-3. Such devices showed a resistance modulation up to 20%, consistent with geometrical parameters and carrier concentration of the semiconducting channel.
引用
收藏
页码:896 / 900
页数:5
相关论文
共 26 条
[11]   Crystalline oxides on silicon: The first five monolayers [J].
McKee, RA ;
Walker, FJ ;
Chisholm, MF .
PHYSICAL REVIEW LETTERS, 1998, 81 (14) :3014-3017
[12]   Physical structure and inversion charge at a semiconductor interface with a crystalline oxide [J].
McKee, RA ;
Walker, FJ ;
Chisholm, MF .
SCIENCE, 2001, 293 (5529) :468-471
[13]   PERMITTIVITY OF STRONTIUM-TITANATE [J].
NEVILLE, RC ;
MEAD, CA ;
HOENEISE.B .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (05) :2124-&
[14]   Damage evolution in ferroelectric PZT induced by bipolar electric cycling [J].
Nuffer, J ;
Lupascu, DC ;
Rödel, J .
ACTA MATERIALIA, 2000, 48 (14) :3783-3794
[15]   All-perovskite-oxide ferroelectric memory transistor composed of Bi2Sr2CuOx and PbZr0.5Ti0.5O3 films [J].
Ota, H ;
Fujino, H ;
Migita, S ;
Xiong, SB ;
Sakai, S .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (12) :8153-8158
[16]   SrTiO3-based metal-insulator-semiconductor heterostructures [J].
Pallecchi, I ;
Grassano, G ;
Marré, D ;
Pellegrino, L ;
Putti, M ;
Siri, AS .
APPLIED PHYSICS LETTERS, 2001, 78 (15) :2244-2246
[17]   Fabrication of submicron-scale SrTiO3-δ devices by an atomic force microscope [J].
Pellegrino, L ;
Pallecchi, I ;
Marré, D ;
Bellingeri, E ;
Siri, AS .
APPLIED PHYSICS LETTERS, 2002, 81 (20) :3849-3851
[18]   Critical current in a spin injection device [J].
Sarkar, S ;
Raychaudhuri, P ;
Mal, PK ;
Bhangale, AR ;
Pinto, R .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (11) :7502-7504
[19]   FERROELECTRIC MEMORIES [J].
SCOTT, JF ;
DEARAUJO, CAP .
SCIENCE, 1989, 246 (4936) :1400-1405
[20]   Intrinsic electrical properties of Au/SrTiO3 Schottky junctions [J].
Shimizu, T ;
Okushi, H .
JOURNAL OF APPLIED PHYSICS, 1999, 85 (10) :7244-7251