Electron transport in a model Si transistor

被引:32
作者
Banoo, K [1 ]
Lundstrom, MS [1 ]
机构
[1] Purdue Univ, W Lafayette, IN 47907 USA
关键词
nanoscale transport; BTE; macroscopic models; quasi-ballistic;
D O I
10.1016/S0038-1101(00)00096-4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A model transistor is defined and used to understand steady-state electron transport ill nanoscale silicon transistors. For this model device, the electric field profile is fixed and not computed self-consistently from the carrier density profile. The current versus voltage (I-V) characteristics of the model device as well as the internal carrier density and velocity profiles are computed by solving the Boltzmann transport equation. We find that the I-V characteristics of the model transistor can be explained by simple, physical arguments even when the critical regions are of the order of a mean free path and strong off-equilibrium transport occurs. This analysis provides insight into the current-limiting mechanisms of a nanoscale transistor. It also provides a basis For testing some commonly used transport models and shows that many of them are seriously unphysical at nanoscale dimensions. (C) 2000 Elsevier Science Ltd. All rights reserved.
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页码:1689 / 1695
页数:7
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