X-ray high-resolution diffraction using refractive lenses

被引:32
作者
Drakopoulos, M [1 ]
Snigirev, A
Snigireva, I
Schilling, J
机构
[1] Diamond Light Source Ltd, Didcot OX11 0QX, Oxon, England
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[3] CALTECH, Pasadena, CA 91125 USA
关键词
D O I
10.1063/1.1843282
中图分类号
O59 [应用物理学];
学科分类号
摘要
Refractive x-ray lenses have recently been applied for imaging and scanning microscopy with hard x rays. We report the application of refractive lenses in an optical scheme for high-resolution x-ray diffraction, performed at a high brilliance synchrotron radiation source. An experimental proof of principle and a theoretical discussion are presented. In particular, we observe the x-ray diffraction pattern from a two-dimensional photonic crystal with 4.2 mum periodicity, which normally is employed to scatter light in the infrared. (C) 2005 American Institute of Physics.
引用
收藏
页码:014102 / 1
页数:3
相关论文
共 22 条
[1]   Synchrotron hard x-ray microprobe:: Fluorescence imaging of single cells [J].
Bohic, S ;
Simionovici, A ;
Snigirev, A ;
Ortega, R ;
Devès, G ;
Heymann, D ;
Schroer, CG .
APPLIED PHYSICS LETTERS, 2001, 78 (22) :3544-3546
[2]   SMALL ANGLE X-RAY SCATTERING BY SPHERICAL PARTICLES OF POLYSTYRENE AND POLYVINYLTOLUENE [J].
BONSE, U ;
HART, M .
ZEITSCHRIFT FUR PHYSIK, 1966, 189 (02) :151-&
[3]  
Born M., 1999, PRINCIPLES OPTICS
[4]   Dislocation density analysis in single grains of steel by X-ray scanning microdiffraction [J].
Castelnau, O ;
Drakopoulos, M ;
Schroer, C ;
Snigireva, I ;
Snigirev, A ;
Ungar, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 467 :1245-1248
[5]   X-ray standing wave microscopy: Chemical microanalysis with atomic resolution [J].
Drakopoulos, M ;
Zegenhagen, J ;
Snigirev, A ;
Snigireva, I ;
Hauser, M ;
Eberl, K ;
Aristov, V ;
Shabelnikov, L ;
Yunkin, V .
APPLIED PHYSICS LETTERS, 2002, 81 (12) :2279-2281
[6]   Interfacial melting of ice in contact with SiO2 -: art. no. 205701 [J].
Engemann, S ;
Reichert, H ;
Dosch, H ;
Bilgram, J ;
Honkimäki, V ;
Snigirev, A .
PHYSICAL REVIEW LETTERS, 2004, 92 (20) :205701-1
[7]   Planar parabolic lenses for focusing high energy X-rays [J].
Grigoriev, M ;
Shabelnikov, L ;
Yunkin, V ;
Snigirev, A ;
Snigireva, I ;
Di Michiel, A ;
Kuznetsov, S ;
Hoffman, M ;
Voges, E .
X-RAY MIRRORS, CRYSTALS AND MULTILAYERS, 2001, 4501 :185-192
[8]   Effective pinhole-collimated ultrasmall-angle x-ray scattering instrument for measuring anisotropic microstructures [J].
Ilavsky, J ;
Allen, AJ ;
Long, GG ;
Jemian, PR .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2002, 73 (03) :1660-1662
[9]   X-ray imaging with submicrometer resolution employing transparent luminescent screens [J].
Koch, A ;
Raven, C ;
Spanne, P ;
Snigirev, A .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1998, 15 (07) :1940-1951
[10]   Diffraction.theory of imaging with X-ray compound refractive lens [J].
Kohn, V ;
Snigireva, I ;
Snigirev, A .
OPTICS COMMUNICATIONS, 2003, 216 (4-6) :247-260