Lateral selectivity of ion-induced quantum well intermixing

被引:14
作者
Haysom, JE [1 ]
Poole, PJ
Feng, Y
Koteles, ES
He, JJ
Charbonneau, S
Goldberg, RD
Mitchell, IV
机构
[1] Natl Res Council Canada, Inst Microstruct Studies, Ottawa, ON K1A 0R6, Canada
[2] Univ Ottawa, Dept Phys, Ottawa, ON K1N 6N5, Canada
[3] Univ Western Ontario, Dept Phys, London, ON N6A 3K7, Canada
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1998年 / 16卷 / 02期
关键词
D O I
10.1116/1.581064
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Quantum well (QW) intermixing using high-energy ion implantation is a promising technique for laterally selective, post-growth modification of a quantum well structure. In this work, we investigate the lateral selectivity of the technique, which is a function of the ion straggling during implantation and of the lateral diffusion of defects during post-implantation annealing. We have used photoluminescence and a specially designed mask to monitor the intermixing of QWs under masked regions. A significant amount of intermixing, resulting in a blueshift of the QW band-gap energy, was observed when the mask stripe width was less than 5 mu m, thus giving a lateral selectivity of 2.5 mu m. (C) 1998 American Vacuum Society. [S0734-2101(98)03502-7].
引用
收藏
页码:817 / 820
页数:4
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