High-density GaAs/AlAs quantum wires grown on (775)B-oriented GaAs substrates by molecular beam epitaxy

被引:56
作者
Higashiwaki, M
Yamamoto, M
Higuchi, T
Shimomura, S
Adachi, SA
Okamoto, Y
Sano, N
Hiyamizu, S
机构
[1] KWANSEI GAKUIN UNIV, FAC SCI, NISHINOMIYA, HYOGO 662, JAPAN
[2] NISSHIN ELECT CO LTD, UKYO KU, KYOTO 615, JAPAN
[3] KUBOTA CORP, RES HEADQUARTERS, AMAGASAKI, HYOGO 661, JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1996年 / 35卷 / 5B期
关键词
quantum wire; molecular beam epitaxy; (775)B; GaAs; corrugation; atomic force microscopy; transmission electron microscopy; photoluminescence; polarization;
D O I
10.1143/JJAP.35.L606
中图分类号
O59 [应用物理学];
学科分类号
摘要
GaAs/AlAs quantum wires (QWRs) were found to be naturally formed by a regularly corrugated AlAs/GaAs interface and a flat GaAs/AlAs interface in an AlAs/GaAs/AlAs quantum well with a well width of 3.3 nm grown on a (775)B GaAs substrate by molecular beam epitaxy. The lateral period and vertical amplitude of the AlAs/GaAs interface corrugation were 12 nm and 1.2 nm, respectively. The QWRs were formed side by side with an extremely high density of 8x10(5) QWRs/cm. A photoluminescence peak at lambda = 715 nm from the QWRs with a cross section of about 12x3 nm(2) showed a polarization degree of (I-parallel to - I-perpendicular to)/(I-parallel to + I-perpendicular to) = 0.11 and a very small full width at half maximum of 15 meV at 4.2 K.
引用
收藏
页码:L606 / L608
页数:3
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