GaAs/Ge/GaAs sublattice reversal epitaxy on GaAs (100) and (111) substrates for nonlinear optical devices

被引:65
作者
Koh, S
Kondo, T
Ebihara, M
Ishiwada, T
Sawada, H
Ichinose, H
Shoji, I
Ito, R
机构
[1] Univ Tokyo, Fac Engn, Dept Appl Phys, Bunkyo Ku, Tokyo 1138656, Japan
[2] Univ Tokyo, Fac Engn, Dept Mat Sci, Bunkyo Ku, Tokyo 1138656, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1999年 / 38卷 / 5A期
关键词
sublattice reversal; domain inversion; molecular beam epitaxy; antiphase domain; nonlinear optics; frequency conversion; quasi phase matching;
D O I
10.1143/JJAP.38.L508
中图分类号
O59 [应用物理学];
学科分类号
摘要
Sublattice reversal epitaxy is demonstrated in lattice-matched GaAs/Ge/GaAs (100) and (111) systems using molecular beam epitaxy, and confirmed by reflection high energy electron diffraction and preferential etching. In the GaAs/Gc/GaAs (100) system, the sublattice reversal is assisted by self-annihilation of the antiphase domains generated at the GaAs/Ge interface. In the GaAs/Ge/GaAs (111) system, the sublattice reversal results from the unique structure of the As-terminated Ge (111) surfaces. The quality of the sublattice-reversed GaAs crystal is investigated using cross-sectional transmission electron microscopy. A method to fabricate a periodically domain-inverted structure using sublattice reversal epitaxy is demonstrated for the GaAs/Ge/GaAs (100) system.
引用
收藏
页码:L508 / L511
页数:4
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