Light impurities and their interactions in silicon

被引:47
作者
Newman, RC
机构
[1] Interdisc. Res. Ctr. Semiconduct. M., Blacken Laboratory, Imp. Coll. Sci., Technol. and Med., London SW7 2BZ, Prince Consort Road
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1996年 / 36卷 / 1-3期
关键词
impurities; silicon; THERMAL DONOR FORMATION; NITROGEN-OXYGEN COMPLEXES; NUCLEAR DOUBLE-RESONANCE; INFRARED-ABSORPTION; CZOCHRALSKI-SILICON; NEUTRON-SCATTERING; DOPED SILICON; PRECIPITATION; DEFECTS; HYDROGEN;
D O I
10.1016/0921-5107(95)01271-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The properties of isolated oxygen, carbon, nitrogen and hydrogen impurities in silicon are outlined. The precipitation of oxygen from solution is then discussed, first for temperatures above 500 degrees C and then for temperatures below 500 degrees C. It is at these lower temperatures that thermal donors are formed. To generate oxygen clusters containing up to say 10 atoms at 450 degrees C it is necessary to take dissociation of smaller oxygen clusters into account and also to invoke rapid diffusion of O-2 dimers. It is demonstrated that as-grown Czochralski crystals may contain hydrogen impurities that enhance the diffusion of single oxygen atoms, while these impurities are also incorporated in certain oxygen clusters that act as shallow donors. It is possible that dimer interactions with O-i atoms lead to enhancements in D-oxy.
引用
收藏
页码:1 / 12
页数:12
相关论文
共 88 条
[1]  
AMMON WV, 1995, MATER SCI ENG B, V36
[2]   INTERLABORATORY DETERMINATION OF THE CALIBRATION FACTOR FOR THE MEASUREMENT OF THE INTERSTITIAL OXYGEN-CONTENT OF SILICON BY INFRARED-ABSORPTION [J].
BAGHDADI, A ;
BULLIS, WM ;
CROARKIN, MC ;
LI, YZ ;
SCACE, RI ;
SERIES, RW ;
STALLHOFER, P ;
WATANABE, M .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1989, 136 (07) :2015-2024
[3]   EFFECT OF CARBON ON LATTICE PARAMETER OF SILICON [J].
BAKER, JA ;
TUCKER, TN ;
MOYER, NE ;
BUSCHERT, RC .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (09) :4365-&
[4]  
Bender H., 1994, Handbook on Semiconductors, V3, P1637
[5]   A STUDY OF OXYGEN PRECIPITATION IN SILICON USING HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY, SMALL-ANGLE NEUTRON-SCATTERING AND INFRARED-ABSORPTION [J].
BERGHOLZ, W ;
BINNS, MJ ;
BOOKER, GR ;
HUTCHISON, JC ;
KINDER, SH ;
MESSOLORAS, S ;
NEWMAN, RC ;
STEWART, RJ ;
WILKES, JG .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1989, 59 (05) :499-522
[6]   HYDROGEN SOLUBILITY IN SILICON AND HYDROGEN DEFECTS PRESENT AFTER QUENCHING [J].
BINNS, MJ ;
MCQUAID, SA ;
NEWMAN, RC ;
LIGHTOWLERS, EC .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1993, 8 (10) :1908-1911
[7]  
BOND WL, 1960, J PHYS CHEM SOLIDS, V30, P1493
[8]  
BRELOT A, 1972, THESIS U PARIS
[9]   DEEP-LEVEL NITROGEN CENTERS IN LASER-ANNEALED ION-IMPLANTED SILICON [J].
BROWER, KL .
PHYSICAL REVIEW B, 1982, 26 (11) :6040-6052
[10]   NEW OXYGEN INFRARED BANDS IN ANNEALED IRRADIATED SILICON [J].
CORBETT, JW ;
MCDONALD, RS ;
WATKINS, GD .
PHYSICAL REVIEW, 1964, 135 (5A) :1381-+