Piezoelectric coefficient measurements in ferroelectric single crystals using high voltage atomic force microscopy

被引：23

作者：

Agronin, AG ^{[1
]}

Rosenwaks, Y ^{[1
]}

Rosenman, GI ^{[1
]}

机构：

[1] Tel Aviv Univ, Dept Elect Engn Phys Elect, IL-69978 Tel Aviv, Israel

来源：

NANO LETTERS | 2003年 / 3卷 / 02期

关键词：

D O I：

10.1021/nl0258933

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We report on the use of high voltage atomic force microscopy for direct measurements of the piezoelectric coefficient d(33) of monodomain RbTiOPO4 ferroelectric crystal. The measurements are compared with the conventional ac voltage modulation atomic force microscopy based technique, which needs calibration of the measurement apparatus. The comparison of the two measurement methods with literature reported values is discussed.

引用

页码：169 / 171

页数：3

共 17 条

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