Sensitization of the minority carrier lifetime in hydrogenated amorphous silicon

被引:11
作者
Rapaport, R
Lubianiker, Y
Balberg, I [1 ]
Fonseca, L
机构
[1] Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel
[2] Univ Puerto Rico, Dept Phys, Rio Piedras, PR 00931 USA
关键词
D O I
10.1063/1.120658
中图分类号
O59 [应用物理学];
学科分类号
摘要
While sensitization of the photoconductivity, i.e., the increase of the majority carrier lifetime by the addition of recombination centers, is known for many years, there was no evidence or suggestion for the corresponding sensitization of the minority carrier lifetime. In this letter, we present experimental evidence for the existence of such an effect in device quality undoped hydrogenated amorphous silicon films. We propose possible scenarios that can yield the observed effect and mention the possible benefits of the minority carrier sensitization for the improvement of bipolar optoelectronic devices made of this material. (C) 1998 American Institute of Physics.
引用
收藏
页码:103 / 105
页数:3
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