Effect of aging on the growth of intermetallic compounds at the interface of Sn-9Zn-xAg/Cu substrates

被引:26
作者
Chang, TC
Wang, MC
Hon, MH
机构
[1] Natl Cheng Kung Univ, Dept Mat Sci & Engn, Tainan 70101, Taiwan
[2] Natl Kaohsiung Univ Appl Sci, Dept Mech Engn, Kaohsiung 80782, Taiwan
关键词
crystallite; diffusion; interface; X-ray diffraction; crystal growth; alloy;
D O I
10.1016/S0022-0248(02)02252-2
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The crystal growth of intermetallic compounds at the interface of Sn-9Zn-xAg/Cu (x = 0, 0.5, 1.5, 2.5 and 3.5 wt%) lead-free solders has been investigated by optical microscope, X-ray diffractometer, scanning electron microscope, and energy dispersive spectrometer. The results show that the more Ag is added to the Sn-9Zn alloy, the more Ag-Zn compounds form in the solder matrix in which Zn reacts with Ag and hinders the diffusion of Ag. Ag dissolves in CU6Sn5 and changes the lattice constant Of CU6Sn5 as formed in the liquid-solid reaction. After long-term aging, the dissolved Ag is repelled from Cu6Sn5 and forms Ag3Sn with Sn at the interface, but the crystallite size Of CU6Sn5 decreases from 301.2 to 189.5 nm when the Ag content increases from 0 to 3.5 wt%. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:236 / 243
页数:8
相关论文
共 13 条
[1]   Microstructure and shear strength evolution of SnAg/Cu surface mount solder joint during aging [J].
Ahat, S ;
Sheng, M ;
Luo, L .
JOURNAL OF ELECTRONIC MATERIALS, 2001, 30 (10) :1317-1322
[2]   Microstructure and adhesion properties of Sn-0.7Cu/Cu solder joints [J].
Bae, KS ;
Kim, SJ .
JOURNAL OF MATERIALS RESEARCH, 2002, 17 (04) :743-746
[3]  
CHANG TC, UNPUB MAT RES B
[4]  
CHANG TC, UNPUB METALL MAT T A
[5]  
Cullity B.D., 1978, Addison-Wesley Series in Metallurgy and Materials, Vsecond
[6]  
Frear D. R., 1991, SOLDER MECH STATE AR, P29
[7]   The role of intermetallic compounds in lead-free soldering [J].
Harris, PG ;
Chaggar, KS .
SOLDERING & SURFACE MOUNT TECHNOLOGY, 1998, 10 (03) :38-+
[8]   Strength of bonding interface in lead-free Sn alloy solders [J].
Kikuchi, S ;
Nishimura, M ;
Suetsugu, K ;
Ikari, T ;
Matsushige, K .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2001, 319 :475-479
[9]   Morphology, kinetics, and thermodynamics of solid-state aging of eutectic SnPb and Pb-free solders (Sn-3.5Ag, Sn-3.8Ag-0.7Cu and Sn-0.7Cu) on Cu [J].
Lee, TY ;
Choi, WJ ;
Tu, KN ;
Jang, JW ;
Kuo, SM ;
Lin, JK ;
Frear, DR ;
Zeng, K ;
Kivilahti, JK .
JOURNAL OF MATERIALS RESEARCH, 2002, 17 (02) :291-301
[10]   IMPROVED MECHANICAL-PROPERTIES IN NEW, PB-FREE SOLDER ALLOYS [J].
MCCORMACK, M ;
JIN, S .
JOURNAL OF ELECTRONIC MATERIALS, 1994, 23 (08) :715-720