Dynamics of small amplitude, off-resonance AFM

被引：18

作者：

Hoffmann, PM ^{[1
]}

机构：

[1] Wayne State Univ, Dept Phys, Detroit, MI 48201 USA

来源：

APPLIED SURFACE SCIENCE | 2003年 / 210卷 / 1-2期

关键词：

non-contact AFM; off-resonance; small amplitude; atomic force microscopy;

D O I：

10.1016/S0169-4332(02)01494-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Most current non-contact-atomic force microscopy (nc-AFM) techniques rely on vibrating the measuring lever at resonance using amplitudes that are large compared to typical interaction length scales. Here we present results of simulations that show that off-resonance, small amplitude AFM provides an alternative non-contact technique in which force gradients can be measured directly without the need of mathematical de-convolution. We show that under a wide range of reasonable conditions the measurements are linear and quantitative. (C) 2002 Elsevier Science B.V. All rights reserved.

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页码：140 / 145

页数：6

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