Defect engineering radiation tolerant silicon detectors

被引:10
作者
MacEvoy, BC
Watts, SJ
机构
[1] Univ London Imperial Coll Sci Technol & Med, Blackett Lab, London SW7 2AZ, England
[2] Brunel Univ, Dept Phys, Uxbridge UB8 3PH, Middx, England
关键词
silicon; defect engineering; radiation; particle detectors;
D O I
10.4028/www.scientific.net/SSP.57-58.221
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
It is planned to use silicon detectors for many applications at the CERN Large Hadron Collider, where they will be exposed to unprecedented particle fluences. After hadronic irradiation, such detectors exhibit macroscopic changes in their electrical characteristics which lead to a degradation in performance. It is shown that these changes can be explained at the microscopic level using a combination of defect kinetics, defect characterisation of irradiated devices and device models. New results include evidence for inter-centre charge transfer between clustered defects and indications of multi-interstitial and multi-vacancy related defects. Finally, the work of the ROSE Collaboration (CERN RD48), whose aim is to defect engineer more radiation tolerant detectors, is described.
引用
收藏
页码:221 / 231
页数:11
相关论文
共 24 条
[1]  
BATES SJ, 1995, CERNECP9518
[2]  
*CMS COLL, 1994, CERNLHCC9438
[3]   THE 1018 MEV (W OR I1) VIBRONIC BAND IN SILICON [J].
DAVIES, G ;
LIGHTOWLERS, EC ;
CIECHANOWSKA, ZE .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1987, 20 (02) :191-205
[4]   A MODEL FOR RADIATION-DAMAGE EFFECTS IN CARBON-DOPED CRYSTALLINE SILICON [J].
DAVIES, G ;
LIGHTOWLERS, EC ;
NEWMAN, RC ;
OATES, AS .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1987, 2 (08) :524-532
[5]  
DEZILLIE B, 1996, UNPUB INT C RAD EFF
[6]  
DEZILLIE B, 1996, NUCL INSTR METH A
[7]  
FEICK H, 1997, THESIS HAMBURG U
[8]   RADIATION-DAMAGE BY NEUTRONS AND PHOTONS TO SILICON DETECTORS [J].
GILL, K ;
HALL, G ;
ROE, S ;
SOTTHIBANDHU, S ;
WHEADON, R ;
GIUBELLINO, P ;
RAMELLO, L .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1992, 322 (02) :177-188
[9]  
GILL K, 1997, IN PRESS J APPL PHYS
[10]   EPR STUDIES OF DEFECTS IN ELECTRON-IRRADIATED SILICON - TRIPLET-STATE OF VACANCY-OXYGEN COMPLEXES [J].
LEE, YH ;
CORBETT, JW .
PHYSICAL REVIEW B, 1976, 13 (06) :2653-2666