Dual-gate AlGaN/GaN modulation-doped field-effect transistors with cut-off frequencies fT > 60 GHz

被引:31
作者
Chen, CH [1 ]
Coffie, R [1 ]
Krishnamurthy, K [1 ]
Keller, S [1 ]
Rodwell, M [1 ]
Mishra, UK [1 ]
机构
[1] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
基金
美国国家科学基金会;
关键词
AlGaN/GaN; broadband power amplifiers; dual-gate FETs;
D O I
10.1109/55.887461
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrate dual-gate AlGaN/GaN modulation-doped field-effect transistors (MODFETs) with gate-lengths of 0.16 mum and 0.35 mum for the first and second gates, respectively. The dual-gate device exhibits a current-gain cut-off frequency f(T) > 60 GHz, and can simultaneously achieve a high breakdown voltage of >+100 V. In comparison to single-gate devices with the same gate length 0.16 mum, dual-gate FETs can significantly increase breakdown voltages, largely increasing the maximum allowable drain bias for high power application. The continuous wave (CW) output power is in excess of 3.5 W/mm at 8.2 GHz, The corresponding large-signal gain is 12 dB and the power added efficiency is 45%, The dual-gate device with different gate lengths shows the capability of providing simultaneous high cut-off frequencies, and high breakdown voltages for broadband power amplifiers.
引用
收藏
页码:549 / 551
页数:3
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