Orientation-dependent x-ray absorption fine structure of ZnO nanorods

被引：55

作者：

Han, SW ^{[1
]}

Yoo, HJ

An, SJ

Yoo, J

Yi, GC

机构：

[1] Chonbuk Natl Univ, Div Sci Educ, Jeonju 561756, South Korea

[2] Pohang Univ Sci & Technol, Natl CRI Ctr Semicond Nanorods, Pohang 790784, South Korea

[3] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea

来源：

APPLIED PHYSICS LETTERS | 2005年 / 86卷 / 02期

关键词：

D O I：

10.1063/1.1851616

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The local structure of two samples of vertically well-aligned ZnO nanorods with average diameters of 13 and 37 nm were studied using orientation-dependent x-ray absorption fine structure (XAFS) at the Zn K edge. The aligned ZnO nanorod samples were fabricated on sapphire (0001) substrates with a catalyst-free metalorganic vapor-phase epitaxy method. The XAFS measurements showed that both nanorod samples have a well-ordered wurtzite structure and that no vacancy was observed at either site of zinc or oxygen atoms. However, we found that in both samples the lattice constants of a and b were shrunken by similar to0.04 Angstrom while c was elongated by similar to0.1 Angstrom, compared with those of their bulk counterparts. Furthermore, there was a substantial amount of disorder in the bond length of the only Zn-O pairs located near the ab plane. This may suggest that the terminating atoms at the boundaries of the nanorods are oxygen atoms. (C) 2005 American Institute of Physics.

引用

页码：021917 / 1

页数：3

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