Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

被引：74

作者：

Favre-Nicolin, V. ^{[1
,2
]}

Mastropietro, F. ^{[1
,3
]}

Eymery, J. ^{[1
]}

Camacho, D. ^{[1
]}

Niquet, Y. M. ^{[1
]}

Borg, B. M. ^{[4
]}

Messing, M. E. ^{[4
]}

Wernersson, L-E ^{[4
]}

Algra, R. E. ^{[5
,6
,7
]}

Bakkers, E. P. A. M. ^{[6
]}

Metzger, T. H. ^{[3
]}

Harder, R. ^{[8
]}

Robinson, I. K. ^{[9
,10
]}

机构：

[1] CEA, INAC, SP2M, F-38054 Grenoble, France

[2] Univ Grenoble 1, Grenoble, France

[3] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[4] Lund Univ, Dept Solid State Phys, S-22100 Lund, Sweden

[5] Mat Innovat Inst M2i, NL-2628 CD Delft, Netherlands

[6] Philips Res Labs, NL-5656 AE Eindhoven, Netherlands

[7] Radboud Univ Nijmegen, IMM, NL-6525 AJ Nijmegen, Netherlands

[8] Argonne Natl Lab, Argonne, IL 60439 USA

[9] UCL, London Ctr Nanotechnol, London WC1H 0AH, England

[10] Diamond Light Source, Didcot OX11 0DE, Oxon, England

来源：

NEW JOURNAL OF PHYSICS | 2010年 / 12卷

基金：

英国工程与自然科学研究理事会;

关键词：

TWINNING SUPERLATTICES; PHASE RETRIEVAL; GROWTH; ENERGY; DIFFUSION;

D O I：

10.1088/1367-2630/12/3/035013

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.

引用

页数：17

共 59 条

[1] Twinning superlattices in indium phosphide nanowires [J].

Algra, Rienk E. ;

Verheijen, Marcel A. ;

Borgstrom, Magnus T. ;

Feiner, Lou-Fe ;

Immink, George ;

van Enckevort, Willem J. P. ;

Vlieg, Elias ;

Bakkers, Erik P. A. M. .

NATURE, 2008, 456 (7220) :369-372

[2] FRESNEL ZONE PLATE FOR OPTICAL IMAGE FORMATION USING EXTREME ULTRAVIOLET AND SOFT X RADIATION [J].

BAEZ, AV .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (04) :405-&

[3] Optical properties of rotationally twinned InP nanowire heterostructures [J].

Bao, Jiming ;

Bell, David C. ;

Capasso, Federico ;

Wagner, Jakob B. ;

Martensson, Thomas ;

Tragardh, Johanna ;

Samuelson, Lars .

NANO LETTERS, 2008, 8 (03) :836-841

[4] Three-dimensional coherent x-ray diffraction imaging of a ceramic nanofoam: Determination of structural deformation mechanisms [J].

Barty, A. ;

Marchesini, S. ;

Chapman, H. N. ;

Cui, C. ;

Howells, M. R. ;

Shapiro, D. A. ;

Minor, A. M. ;

Spence, J. C. H. ;

Weierstall, U. ;

Ilavsky, J. ;

Noy, A. ;

Hau-Riege, S. P. ;

Artyukhin, A. B. ;

Baumann, T. ;

Willey, T. ;

Stolken, J. ;

van Buuren, T. ;

Kinney, J. H. .

PHYSICAL REVIEW LETTERS, 2008, 101 (05)

[5]

BEITRA L, 2009, P INT C SYNCHR UNPUB

[6] MOVPE GROWTH AND STRUCTURAL CHARACTERIZATION OF EXTREMELY LATTICE-MISMATCHED InP-InSb NANOWIRE HETEROSTRUCTURES [J].

Borg, B. M. ;

Messing, M. E. ;

Caroff, P. ;

Dick, K. A. ;

Deppert, K. ;

Wernersson, L-E. .

2009 IEEE 21ST INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE & RELATED MATERIALS (IPRM), 2009, :249-252

[7]

Caroff P, 2009, NAT NANOTECHNOL, V4, P50, DOI [10.1038/nnano.2008.359, 10.1038/NNANO.2008.359]

[8] High-quality InAs/InSb nanowire heterostructures grown by metal-organic vapor-phase epitaxy [J].

Caroff, Philippe ;

Wagner, Jakob B. ;

Dick, Kimberly A. ;

Nilsson, Henrik A. ;

Jeppsson, Mattias ;

Deppert, Knut ;

Samuelson, Lars ;

Wallenberg, L. Reine ;

Wernersson, Lars-Erik .

SMALL, 2008, 4 (07) :878-882

[9] InSb heterostructure nanowires: MOVPE growth under extreme lattice mismatch [J].

Caroff, Philippe ;

Messing, Maria E. ;

Borg, B. Mattias ;

Dick, Kimberly A. ;

Deppert, Knut ;

Wernersson, Lars-Erik .

NANOTECHNOLOGY, 2009, 20 (49)

[10] Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction [J].

Chamard, Virginie ;

Stangl, Julian ;

Labat, Stephane ;

Mandl, Bernhard ;

Lechner, Rainer T. ;

Metzger, Till H. .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2008, 41 :272-280

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