Fabrication of ambipolar field-effect transistor device with heterostructure of C60 and pentacene

被引:68
作者
Kuwahara, E [1 ]
Kubozono, Y
Hosokawa, T
Nagano, T
Masunari, K
Fujiwara, A
机构
[1] Okayama Univ, Dept Chem, Okayama 7008530, Japan
[2] Japan Sci & Technol Agcy, CREST, Kawaguchi 3220012, Japan
[3] Japan Inst Sci & Technol, Ishikawa 9231292, Japan
关键词
D O I
10.1063/1.1818336
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ambipolar field-effect transistor (FET) device was fabricated with heterostructure of thin films of C-60 and pentacene. Three types of device structures in the C-60/pentacene heterostructure FET device were studied in order to realize the best ambipolar properties. In the middle-contact type FET device of C-60 and pentacene, the mobility mu in p-channel operation was estimated to be 6.8x10(-2) cm(2) V-1 s(-1), while the mu in n-channel operation was 1.3x10(-3) cm(2) V-1 s(-1). This ambipolar FET device is available for a practical building-block to form CMOS integrated circuits with low-power consumption, good-noise margins, and ease of design. (C) 2004 American Institute of Physics.
引用
收藏
页码:4765 / 4767
页数:3
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