Effect of doping on the density-of-states distribution and carrier hopping in disordered organic semiconductors -: art. no. 045214

被引:283
作者
Arkhipov, VI
Heremans, P
Emelianova, EV
Bässler, H
机构
[1] IMEC, B-3001 Heverlee, Belgium
[2] Univ Louvain, Semicond Phys Lab, B-3001 Heverlee, Belgium
[3] Univ Marburg, Inst Phys Nucl & Macromol Chem, D-35032 Marburg, Germany
关键词
D O I
10.1103/PhysRevB.71.045214
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of doping on the density-of-states (DOS) distribution and charge-carrier transport in a disordered hopping system is considered analytically. It is shown that doping such a system produces a random distribution of dopant ions, which Coulombically interact with carriers localized in intrinsic hopping sites. This interaction further increases the energy disorder and broadens the deep tail of the DOS distribution. Therefore, doping of a disordered organic semiconductor, on the one hand, increases the concentration of charge carriers and lifts up the Fermi level but, on the other hand, creates additional deep Coulombic traps of the opposite polarity. While the former effect facilitates conductivity, the latter strongly suppresses the carrier hopping rate. A model of hopping in a doped disordered organic semiconductor is suggested. It is shown that the doping efficiency strongly depends upon the energy disorder and external electric field.
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页数:7
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