InAlAs avalanche photodiodes with very thin multiplication layer of 0.1μm for highspeed and low-voltage-operation optical receiver

被引:22
作者
Nakata, T [1 ]
Watanabe, I [1 ]
Makita, K [1 ]
Torikai, T [1 ]
机构
[1] NEC Corp Ltd, Syst Devices & Fundmental Res, Photon & Wireless Devices Res Labs, Tsukuba, Ibaraki 3058501, Japan
关键词
D O I
10.1049/el:20001278
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have developed a separated absorption and multiplication (SAM) avalanche photodiode (APD) with the thinnest reported InAlAs multiplication layer of 0.1 mum and achieved 18.8V operation, with high speed and a high GB product of 140GHz. This makes it possible to realise a compact 10Gbit/s APD receiver.
引用
收藏
页码:1807 / 1809
页数:3
相关论文
共 6 条
[1]   Resonant-cavity InGaAs-InAlAs avalanche photodiodes with gain-bandwidth product of 290 GHz [J].
Lenox, C ;
Nie, H ;
Yuan, P ;
Kinsey, G ;
Homles, AL ;
Streetman, BG ;
Campbell, JC .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1999, 11 (09) :1162-1164
[2]   Low excess noise characteristics in thin avalanche region GaAs diodes [J].
Li, KF ;
Ong, DS ;
David, JPR ;
Tozer, RC ;
Rees, GJ ;
Robson, PN ;
Grey, R .
ELECTRONICS LETTERS, 1998, 34 (01) :125-126
[3]   High-frequency response limitation of high-performance InAlGaAs/InAlAs superlattice avalanche photodiodes [J].
Makita, K ;
Nakata, T ;
Watanabe, I ;
Taguchi, K .
ELECTRONICS LETTERS, 1999, 35 (25) :2228-2229
[4]   Monte Carlo estimation of avalanche noise in thin p+-i-n+ GaAs diodes [J].
Ong, DS ;
Li, KF ;
Rees, GJ ;
David, JPR ;
Robson, PN ;
Dunn, GM .
APPLIED PHYSICS LETTERS, 1998, 72 (02) :232-234
[5]   HIGH-SPEED AND LOW-DARK-CURRENT FLIP-CHIP INALAS/INALGAAS QUATERNARY WELL SUPERLATTICE APDS WITH 120 GHZ GAIN-BANDWIDTH PRODUCT [J].
WATANABE, I ;
SUGOU, S ;
ISHIKAWA, H ;
ANAN, T ;
MAKITA, K ;
TSUJI, M ;
TAGUCHI, K .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1993, 5 (06) :675-677
[6]   Reliability of mesa-structure InAlCaAs-InAlAs superlattice avalanche photodiodes [J].
Watanabe, I ;
Tsuji, M ;
Hayashi, M ;
Makita, K ;
Taguchi, K .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1996, 8 (06) :824-826