Theory of loss measurements of Fabry-Perot resonators by Fourier analysis of the transmission spectra

被引：47

作者：

Hofstetter, D ^{[1
]}

Thornton, RL ^{[1
]}

机构：

[1] Xerox Corp, Palo Alto Res Ctr, Palo Alto, CA 94304 USA

来源：

OPTICS LETTERS | 1997年 / 22卷 / 24期

关键词：

D O I：

10.1364/OL.22.001831

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a detailed theoretical analysis for the determination of the total internal loss in Fabry-Perot resonators based on Fourier analysis of the emission or transmission spectrum. The observation of higher-order harmonics and their relative height in the Fourier-transformed spectrum allow us to quantify the total resonator loss. Because this new method considers both contrast and shape of the Fabry-Perot fringes it is especially well suited for the evaluation of high-finesse laser resonators such as those of vertical cavity surface-emitting lasers in terms of propagation loss/gain. (C) 1997 Optical Society of America.

引用

页码：1831 / 1833

页数：3

共 9 条

[1]

BORN M, 1984, PRINCIPLES OPTICS, P256

[2]

Bracewell R. N., 1986, FOURIER TRANSFORM IT, V31999

[3] ANALYSIS OF FABRY-PEROT INTERFEROGRAMS BY MEANS OF THEIR FOURIER TRANSFORMS [J].

COOPER, VG .

APPLIED OPTICS, 1971, 10 (03) :525-&

[4] CW DEGRADATION AT 300 DEGREES K OF GAAS DOUBLE-HETEROSTRUCTURE JUNCTION LASERS .2. ELECTRONIC GAIN [J].

HAKKI, BW ;

PAOLI, TL .

JOURNAL OF APPLIED PHYSICS, 1973, 44 (09) :4113-4119

[5] GAIN SPECTRA IN GAAS DOUBLE-HETEROSTRUCTURE INJECTION LASERS [J].

HAKKI, BW ;

PAOLI, TL .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (03) :1299-1306

[6]

HECHT E, 1976, OPTICS, P307

[7] A SUPERLUMINESCENT DIODE AT 1.3 MU-M WITH VERY-LOW SPECTRAL MODULATION [J].

PATTERSON, BD ;

EPLER, JE ;

GRAF, B ;

LEHMANN, HW ;

SIGG, HC .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1994, 30 (03) :703-712

[8]

STEEL WH, 1983, INTERFEROMETRY, P141

[9] NEW MEASUREMENT SYSTEM FOR FAULT LOCATION IN OPTICAL WAVE-GUIDE DEVICES BASED ON AN INTERFEROMETRIC-TECHNIQUE [J].

TAKADA, K ;

YOKOHAMA, I ;

CHIDA, K ;

NODA, J .

APPLIED OPTICS, 1987, 26 (09) :1603-1606

← 1 →