A two-band analysis of electrical transport in n-type GaN epilayers

被引:2
作者
Cheong, MG [1 ]
Oh, KS
Suh, EK
Lee, HJ
机构
[1] Chonbuk Natl Univ, Dept Semicond Sci & Technol, Chonju 561756, South Korea
[2] Chonbuk Natl Univ, Semicond Phys Res Ctr, Chonju 561756, South Korea
[3] Chonbuk Natl Univ, Dept Phys, Chonju 561756, South Korea
来源
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2 | 1998年 / 264-2卷
关键词
electron scattering; impurity band conduction; mobility; hall scattering factor;
D O I
10.4028/www.scientific.net/MSF.264-268.1385
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Hall mobilities and Hall coefficients were measured as a function of temperature from 10 to 800 K on Si-doped n-type GaN epilayer grown by metalorganic chemical vapor deposition. Numerical method was adopted for the solution of Boltzmann transport equation with various scattering mechanism to analyse the electron behavior in the Gamma band. The electron transport only in single band, the Gamma band, is dominant at high temperatures. The impurity band conduction, however, has to be added to understand experimental data at low temperatures, resulting in a two-band phenomena.
引用
收藏
页码:1385 / 1388
页数:4
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