Effective phase correction function for high-resolution exit wave reconstruction by a three-dimensional Fourier filtering method

被引:6
作者
Kawasaki, T [1 ]
Taya, M [1 ]
Nomaguchi, T [1 ]
Takai, Y [1 ]
机构
[1] Osaka Univ, Grad Sch Engn, Dept Mat & Life Sci, Suita, Osaka 5650871, Japan
关键词
high-resolution transmission electron microscopy; exit wave reconstruction; three-dimensional Fourier filtering method; spherical aberration correction; illumination divergence correction;
D O I
10.1016/j.ultramic.2004.09.004
中图分类号
TH742 [显微镜];
学科分类号
摘要
The phase correction function used in the three-dimensional Fourier filtering method (3D-FFM) for compensating lens aberrations was investigated to reconstruct a high-resolution exit wave of a sample. An appropriate function, which hardly suffered from imperfect illumination conditions, was determined by comparing two types of phase correction functions with numerical calculations and experiments using through-focus images of an amorphous thin film and a [110]-oriented Si single crystal taken under tilted illumination or partially coherent illumination. Theoretical calculations indicated that a function in terms of w (an axial Fourier component), available uniquely in the 3D Fourier space, compensated for the phase shift due to the spherical aberration more precisely than did a conventional function in terms of g (the two-dimensional (2D) planar Fourier components). Experimentally, exit waves reconstructed using the w-function showed sample structures at similar to20% higher resolution than those reconstructed using the g-function. Image contrast simulations proved that the w-function had a significant advantage over the g-function: the former canceled out the effect of illumination divergence, resulting in a high-resolution exit wave. These results demonstrated that exit waves, which are uniquely realized in the 3D-FFM, should be reconstructed using the w-type phase correction function. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:127 / 139
页数:13
相关论文
共 28 条
[1]   Quantitative phase-sensitive imaging in a transmission electron microscope [J].
Bajt, S ;
Barty, A ;
Nugent, KA ;
McCartney, M ;
Wall, M ;
Paganin, D .
ULTRAMICROSCOPY, 2000, 83 (1-2) :67-73
[2]  
BORN M, 1980, PRINCIPLES OPTICS, P468
[3]   Wave function reconstruction in HRTEM: The parabola method [J].
deBeeck, MO ;
VanDyck, D ;
Coene, W .
ULTRAMICROSCOPY, 1996, 64 (1-4) :167-183
[4]   Direct structure reconstruction in HRTEM [J].
deBeeck, MO ;
VanDyck, D .
ULTRAMICROSCOPY, 1996, 64 (1-4) :153-165
[5]   Simultaneous determination of inclusion crystallography and nanotube conformation for a Sb2O3/single-walled nanotube composite -: art. no. 045406 [J].
Friedrichs, S ;
Sloan, J ;
Green, MLH ;
Hutchison, JL ;
Meyer, RR ;
Kirkland, AI .
PHYSICAL REVIEW B, 2001, 64 (04)
[6]   The S-state model: a work horse for HRTEM [J].
Geuens, P ;
Van Dyck, D .
ULTRAMICROSCOPY, 2002, 93 (3-4) :179-198
[7]   MECHANISM OF IMAGE-FORMATION FOR THICK BIOLOGICAL SPECIMENS - EXIT WAVE-FRONT RECONSTRUCTION AND ELECTRON-ENERGY-LOSS SPECTROSCOPIC IMAGING [J].
HAN, KF ;
SEDAT, JW ;
AGARD, DA .
JOURNAL OF MICROSCOPY-OXFORD, 1995, 178 :107-119
[9]  
IKUTA T, 1989, J ELECTRON MICROSC, V38, P415
[10]   Influence of anti-symmetric wave aberrations and the simple correction filter in the Fourier space [J].
Ikuta, T .
JOURNAL OF ELECTRON MICROSCOPY, 1999, 48 (04) :417-429