Effective phase correction function for high-resolution exit wave reconstruction by a three-dimensional Fourier filtering method

被引:6
作者
Kawasaki, T [1 ]
Taya, M [1 ]
Nomaguchi, T [1 ]
Takai, Y [1 ]
机构
[1] Osaka Univ, Grad Sch Engn, Dept Mat & Life Sci, Suita, Osaka 5650871, Japan
关键词
high-resolution transmission electron microscopy; exit wave reconstruction; three-dimensional Fourier filtering method; spherical aberration correction; illumination divergence correction;
D O I
10.1016/j.ultramic.2004.09.004
中图分类号
TH742 [显微镜];
学科分类号
摘要
The phase correction function used in the three-dimensional Fourier filtering method (3D-FFM) for compensating lens aberrations was investigated to reconstruct a high-resolution exit wave of a sample. An appropriate function, which hardly suffered from imperfect illumination conditions, was determined by comparing two types of phase correction functions with numerical calculations and experiments using through-focus images of an amorphous thin film and a [110]-oriented Si single crystal taken under tilted illumination or partially coherent illumination. Theoretical calculations indicated that a function in terms of w (an axial Fourier component), available uniquely in the 3D Fourier space, compensated for the phase shift due to the spherical aberration more precisely than did a conventional function in terms of g (the two-dimensional (2D) planar Fourier components). Experimentally, exit waves reconstructed using the w-function showed sample structures at similar to20% higher resolution than those reconstructed using the g-function. Image contrast simulations proved that the w-function had a significant advantage over the g-function: the former canceled out the effect of illumination divergence, resulting in a high-resolution exit wave. These results demonstrated that exit waves, which are uniquely realized in the 3D-FFM, should be reconstructed using the w-type phase correction function. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:127 / 139
页数:13
相关论文
共 28 条
[21]   Sub-Angstrom high-resolution transmission electron microscopy at 300 keV. [J].
O'Keefe, MA ;
Hetherington, CJD ;
Wang, YC ;
Nelson, EC ;
Turner, JH ;
Kisielowski, C ;
Malm, JO ;
Mueller, R ;
Ringnalda, J ;
Pan, M ;
Thust, A .
ULTRAMICROSCOPY, 2001, 89 (04) :215-241
[22]   Dynamic observation of an atom-sized gold wire by phase electron microscopy [J].
Takai, Y ;
Kawasaki, T ;
Kimura, Y ;
Ikuta, T ;
Shimizu, R .
PHYSICAL REVIEW LETTERS, 2001, 87 (10) :1-106105
[23]   Preliminary experiments for development of real-time defocus-image modulation processing electron microscope [J].
Takai, Y ;
Utsuro, H ;
Kimura, Y ;
Ikuta, T ;
Shimizu, R .
JOURNAL OF ELECTRON MICROSCOPY, 1998, 47 (05) :419-426
[24]  
TANIGUCHI Y, 1991, J ELECTRON MICROSC, V40, P5
[25]  
TANIGUCHI Y, 1992, J ELECTRON MICROSC, V41, P21
[26]   Theoretical background of defocus image modulation processing (DIMP) based on three dimensional optical transfer functions (3D-OTFs) [J].
Utsuro, H ;
Ando, T ;
Takai, Y ;
Shimizu, R ;
Ikuta, T .
OPTIK, 2001, 112 (02) :67-75
[27]   Epitaxial growth of ZnO thin films on ScAlMgO4 (0001) by chemical solution deposition [J].
Wessler, B ;
Steinecker, A ;
Mader, W .
JOURNAL OF CRYSTAL GROWTH, 2002, 242 (3-4) :283-292
[28]   The use of through focus exit wave reconstruction and quantitative electron diffraction in the structure determination of superconductors [J].
Zandbergen, HW ;
Bokel, R ;
Connolly, E ;
Jansen, J .
MICRON, 1999, 30 (05) :395-416