Unique Synthesis of Few-Layer Graphene Films on Carbon-Doped Pt83Rh17 Surfaces

被引：25

作者：

Gao, Jian-Hua ^{[1
]}

Fujita, Daisuke ^{[1
,2
]}

Xu, Ming-Sheng ^{[3
]}

Onishi, Keiko ^{[1
]}

Miyamoto, Satoru ^{[4
]}

机构：

[1] Natl Inst Mat Sci, Adv Nano Characterizat Ctr, Tsukuba, Ibaraki 3050047, Japan

[2] Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton, Tsukuba, Ibaraki 3050047, Japan

[3] Natl Inst Mat Sci, Int Ctr Young Scientists, Tsukuba, Ibaraki 3050047, Japan

[4] Rockgate Co, Bunkyo Ku, Tokyo 1130033, Japan

来源：

ACS NANO | 2010年 / 4卷 / 02期

关键词：

graphene; synthesis; atomic force microscopy; Raman spectroscopy; Auger electron spectroscopy; EPITAXIAL GRAPHENE; RAMAN-SPECTROSCOPY; BERRYS PHASE; LARGE-AREA; SCATTERING; SEGREGATION;

D O I：

10.1021/nn901255u

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We report a unique synthesis of single- and few-layer graphene films on carbon-doped Pt83Rh17 surfaces by surface segregation and precipitation. The ultrathin graphene films were characterized by atomic force microscopy, Auger electron spectroscopy, and micro-Raman spectroscopy measurements, providing evidence of graphene film thickness and structural quality. The G and 2D band intensity images from micro-Raman spectroscopy measurements confirm that the graphene films with different coverage have very limited defects. Additionally, the 2D band peak can be well-fitted by a single Lozentian peak, indicating that graphene films are characteristic of single layer graphene. Graphene film thickness can be determined by analysis of Auger spectra, indicating that graphene films after 850 degrees C annealing mainly consist of monolayer graphene. By precise adjustment of annealing temperature, graphene film thickness and area size can be controlled and uniform large-area single-layer and double-layer graphene can be achieved.

引用

页码：1026 / 1032

页数：7

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