Monitoring electron-beam irradiation effects on graphenes by temporal Auger electron spectroscopy

被引：42

作者：

Xu, Mingsheng ^{[1
,2
,3
]}

Fujita, Daisuke ^{[4
,5
]}

Hanagata, Nobutaka ^{[6
]}

机构：

[1] Natl Inst Mat Sci, Int Ctr Young Scientists, Tsukuba, Ibaraki 3050047, Japan

[2] Zhejiang Univ, Dept Polymer Sci & Engn, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China

[3] Zhejiang Univ, Key Lab Macromol Synth & Functionalizat, Hangzhou 310027, Peoples R China

[4] Natl Inst Mat Sci, Adv Nano Characterizat Ctr, Tsukuba, Ibaraki 3050047, Japan

[5] Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton, Tsukuba, Ibaraki 3050047, Japan

[6] Natl Inst Mat Sci, Nanotechnol Innovat Ctr, Tsukuba, Ibaraki 3050047, Japan

来源：

NANOTECHNOLOGY | 2010年 / 21卷 / 26期

基金：

中国国家自然科学基金;

关键词：

DEFECT FORMATION; SINGLE-LAYER;

D O I：

10.1088/0957-4484/21/26/265705

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Because of its unique electronic transport properties, graphene has attracted an enormous amount of interest recently. By using standard Auger electron spectroscopy and Raman spectroscopy, we have studied electron-beam irradiation effects on graphene damage. We have shown that irradiation with an electron-beam can selectively remove graphene layers and induce chemical reactions, as well as possible structural transformations. We have also demonstrated the dependence of damage in graphene on electron-beam dose. Our work provides ideas on how to optimize the experimental conditions for graphene characterization and device fabrication. The results throw light on how energy transfer from the electron beam to graphene layers leads to the removal of carbon atoms from graphene layers and on the possibility of using electron-beam irradiation to locally induce chemical reactions in a controlled manner.

引用

页数：7

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