Field-effect transistors comprising molecular beam deposited α,ω-di-hexyl-hexathienylene and polymeric insulator
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Dimitrakopoulos, CD
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IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Dimitrakopoulos, CD
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Furman, BK
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IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Furman, BK
[1
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Graham, T
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IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Graham, T
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Hegde, S
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IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Hegde, S
[1
]
Purushothaman, S
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IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Purushothaman, S
[1
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机构:
[1] IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Insulated-gate field-effect transistors (IGFETs) comprising molecular beam deposited alpha,omega-di-hexyl-hexathienylene (DH6T) as the semiconductor layer and different polymeric gate insulators were fabricated and tested. Field-effect mobility values up to 0.13 cm(2) V-1 s(-1) were obtained, which are the highest values obtained from thin-film transistors of DH6T, (C) 1998 Published by Elsevier Science S.A.