Radiation hardness of InGaAs/GaAs quantum dots

被引:44
作者
Guffarth, F
Heitz, R
Geller, M
Kapteyn, C
Born, H
Sellin, R
Hoffmann, A
Bimberg, D
Sobolev, NA
Carmo, MC
机构
[1] Tech Univ Berlin, Inst Festkorperphys, D-10623 Berlin, Germany
[2] Univ Aveiro, Dept Fis, P-3810193 Aveiro, Portugal
关键词
D O I
10.1063/1.1561165
中图分类号
O59 [应用物理学];
学科分类号
摘要
The interaction between point defects in the matrix and excitons localized in self-organized InGaAs/GaAs quantum dots is investigated for structures irradiated by protons. The exciton ground state is demonstrated to be unaffected by radiation doses up to 10(14) p/cm(2). The close proximity of radiation-induced defects leads to a strong nonmonotonous temperature dependence of the luminescence yield: Carriers are lost via tunneling from excited quantum dot states to irradiation-induced defects below similar to100 K, whereas at higher temperatures, carriers escape to the barrier and are captured by defects. (C) 2003 American Institute of Physics.
引用
收藏
页码:1941 / 1943
页数:3
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