Core level spectroscopy and RHEED analysis of KGd(WO4)2 surface

被引：36

作者：

Atuchin, VV ^{[1
]}

Kesler, VG

Maklakova, NY

Pokrovsky, LD

机构：

[1] Russian Acad Sci, SB, Inst Semicond Phys, Lab Opt Mat & Struct, Novosibirsk 630090, Russia

[2] Russian Acad Sci, SB, Inst Semicond Phys, Ctr Tech, Novosibirsk 630090, Russia

[3] Inst Mineral & Petrog, Lab Crystallizat Oxide Mat, Novosibirsk 630090, Russia

来源：

SOLID STATE COMMUNICATIONS | 2005年 / 133卷 / 06期

关键词：

tungstates; RHEED; surface structure; XPS;

D O I：

10.1016/j.ssc.2004.11.042

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Structural and electronic characterisation of mechanically polished (010) KGd(WO4)(2) (KGW) has been produced by reflection high-energy electron diffraction (RHEED) and X-ray photoelectron spectroscopy (XPS). With XPS analysis the original element binding energies, chemical composition and valence band structure of KGW have been determined. (C) 2004 Published by Elsevier Ltd.

引用

页码：347 / 351

页数：5

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