Spectroscopy of nitrogen-related centers in gallium arsenide

被引:19
作者
Alt, HC
Wiedemann, B
Bethge, K
机构
[1] Fachhsch Munich, FB Phys Tech 06, D-80001 Munich, Germany
[2] Goethe Univ Frankfurt, Inst Kernphys, D-60486 Frankfurt, Germany
来源
DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3 | 1997年 / 258-2卷
关键词
GaAs; N impurity; local vibrational modes (LVM); FTIR; spark source mass spectrometry (SSMS);
D O I
10.4028/www.scientific.net/MSF.258-263.867
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Nitrogen-rich poly-and monocrystalline GaAs has been investigated by Fourier transform infrared absorption spectroscopy and radiofrequency spark source mass spectrometry. N concentrations in the 10(16)-cm(-3) range are found in poly samples. A linear relationship exists between the total chemical nitrogen contamination and the intensity of the 470-cm(-1) local vibrational mode. An estimate for the calibration factor is given. The line shape parameters of this line, being significantly different from local modes of other anion site light impurities, are discussed.
引用
收藏
页码:867 / 871
页数:5
相关论文
共 19 条
[1]   NEGATIVE-U PROPERTIES OF OFF-CENTER SUBSTITUTIONAL OXYGEN IN GALLIUM-ARSENIDE [J].
ALT, HC .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1991, 6 (10B) :B121-B129
[2]   LOCAL MODE SPECTROSCOPY OF THE CARBON ACCEPTOR IN GAAS - NEW EXPERIMENTAL ASPECTS [J].
ALT, HC ;
DISCHLER, B .
APPLIED PHYSICS LETTERS, 1995, 66 (01) :61-63
[3]  
COCHRAN W, 1961, J APPL PHYS, V32, P2102, DOI 10.1063/1.1777024
[4]   LOCALIZED VIBRATIONS OF H- AND D- IONS IN ALKALINE EARTH FLUORIDES [J].
ELLIOTT, RJ ;
HAYES, W ;
JONES, GD ;
MACDONAL.HF ;
SENNETT, CT .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1965, 289 (1416) :1-&
[5]  
HAHN WS, 1994, MATER SCI FORUM, V143-, P277, DOI 10.4028/www.scientific.net/MSF.143-147.277
[6]   ION-IMPLANTED NITROGEN IN GALLIUM-ARSENIDE [J].
KACHARE, AH ;
KAHAN, A ;
EULER, FK ;
WHATLEY, TA ;
SPITZER, WG .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (10) :4393-4399
[7]   NITROGEN PAIR LUMINESCENCE IN GAAS [J].
LIU, X ;
PISTOL, ME ;
SAMUELSON, L ;
SCHWETLICK, S ;
SEIFERT, W .
APPLIED PHYSICS LETTERS, 1990, 56 (15) :1451-1453
[8]   HORIZONTAL BRIDGMAN GROWTH OF GAAS DOPED WITH ISOVALENT IMPURITY [J].
MORAVEC, F ;
STEPANEK, B ;
DOUBRAVA, P .
CRYSTAL RESEARCH AND TECHNOLOGY, 1991, 26 (05) :579-585
[9]   BORON AND CARBON IMPURITIES IN GALLIUM-ARSENIDE [J].
NEWMAN, RC ;
THOMPSON, F ;
HYLIANDS, M ;
PEART, RF .
SOLID STATE COMMUNICATIONS, 1972, 10 (06) :505-&
[10]   THE LATTICE LOCATIONS OF SILICON IMPURITIES IN GAAS - EFFECTS DUE TO STOICHIOMETRY, THE FERMI ENERGY, THE SOLUBILITY LIMIT AND DX BEHAVIOR [J].
NEWMAN, RC .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1994, 9 (10) :1749-1762