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Modeling electric-field-sensitive scanning probe measurements for a tip of arbitrary shape

被引：9
作者：
Kujanishvili, I
Chakraborty, S
Maasilta, IJ
Tessmer, SH
Melloch, MR
机构：
[1] Michigan State Univ, Dept Phys & Astron, E Lansing, MI 48824 USA
[2] Purdue Univ, Dept Elect Engn, W Lafayette, IN 47907 USA
来源：
ULTRAMICROSCOPY | 2004年 / 102卷 / 01期
基金：
美国国家科学基金会;
关键词：
microscopic methods; specifically for solid interfaces and multilayers; cryomicroscopic methods;
D O I：
10.1016/j.ultramic.2004.07.004
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We present a numerical method to model electric-field-sensitive scanning probe microscopy measurements which allows for a tip of arbitrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：7 / 12
页数：6
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