Observed effects of a changing step-edge density on thin-film growth dynamics

被引：24

作者：

Fleet, A ^{[1
]}

Dale, D

Suzuki, Y

Brock, JD

机构：

[1] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA

[2] Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA

[3] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA

[4] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA

来源：

PHYSICAL REVIEW LETTERS | 2005年 / 94卷 / 03期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1103/PhysRevLett.94.036102

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We grew SrTiO3 on SrTiO3(001) by pulsed laser deposition, while observing x-ray diffraction at the (00 1/2) position. The drop DeltaI in the x-ray intensity following a laser pulse contains information about plume-surface interactions. Kinematic theory predicts DeltaI/I=-4sigma(1-sigma), so that DeltaI/I depends only on the amount of deposited material sigma. In contrast, we observed experimentally that \DeltaI/I|<4sigma(1-sigma) and that DeltaI/I depends on the phase of x-ray growth oscillations. The combined results suggest a fast smoothing mechanism that depends on surface step-edge density.

引用

页数：4

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